D.A. Oumar1, M.I. Boukhari2, N.I. Mariam3, S. Capraro4, and J. J. Rousseau5
1 Department of Industrial Engineering and Maintenance, Polytechnical University of Mongo, Mongo, Chad
2 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
3 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
4 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
5 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
Original language: English
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Abstract
The characterization of planar components such as inductors in an important step in better to understand components behavior as a function of frequency. To do this, it is essential to use a dedicated measuring device and an innovative and appropriate characterization method to achieve good accuracy. In this article, we present a new method and techniques for characterizing Zij impedance and Yij admittance parameters of passive components (resistors, capacitors and inductors) using a WK6500B impedancemeter. Obtained results are very encouraging, with good accuracy of less than 1%.
Author Keywords: Zij and Yij parameters, WK 6500B impedancemeter, integrated passives components.
